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1

[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - An Approach for a Comprehensive QA Methodology for the PDKs

Joshi, Sridhar, Perumal, Ravi, Gadepally, Kamesh, Young, Mark

Year:

2008

Language:

english

File:

PDF, 269 KB

english, 2008

2

[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - Strategies for Quality CAD PDKs

Gadepally, Kamesh V., Young, Mark, Lin, James, Franklin, Andy, Perumal, Ravi, Joshi, Sridhar

Year:

2008

Language:

english

File:

PDF, 385 KB

english, 2008

3

SPIE Proceedings [SPIE Microelectronic Manufacturing '95 - Austin, TX (Wednesday 25 October 1995)] Microelectronic Device and Multilevel Interconnection Technology - Development and production integration of a planarized AlCu interconnect process for submicron CMOS

Brown, Kevin C., Hill, Rodney, Reddy, Krishna, Gadepally, Kamesh, Chen, Ih-Chin, Dixit, Girish A., Doan, Trung T., Sasaki, Nobuo

Year:

1995

Language:

english

File:

PDF, 778 KB

english, 1995

4

Aerosol Deposition and Film Formation using Silicon Powder

Gadepally, Kamesh V., Tennal, K. B., Hawk, R. M., Brown, W. D.

Journal:

MRS Proceedings

Year:

1990

Language:

english

File:

PDF, 266 KB

english, 1990

5

Formation of Silicon-on-Insulator Films from Powders

Gadepally, Kamesh V., Hawk, Roger M., Brown, William D.

Journal:

MRS Proceedings

Year:

1991

Language:

english

File:

PDF, 1.06 MB

english, 1991

6

Effect of TiW As Adhesion Layer And Underlying Metal On Electromigration Characteristics of Tungsten Via Plugs

Gadepally, Kamesh, Reddy, Padala Krishna, Niew, Siew, Merrill, Richard, Lahri, Rajeeva, Biswal, Madan

Journal:

MRS Proceedings

Year:

1993

Language:

english

File:

PDF, 1.94 MB

english, 1993

7

Electromigration Properties and their Correlation to the Physical Characteristics of Multilevel Metallizations

Gadepally, Kamesh, Geha, Sam, Myers, Edward R., Thomas, Michael E.

Journal:

MRS Proceedings

Year:

1994

Language:

english

File:

PDF, 2.06 MB

english, 1994

8

Reliability Issues with Mixed-Signal CMOS Technology

Lahri, Rajeeva, Chen, Hung-Sheng, Zhao, Ji, Gadepally, Kamesh, Teng, C.S.

Journal:

MRS Proceedings

Year:

1995

Language:

english

File:

PDF, 1.18 MB

english, 1995

9

[IEEE 2013 14th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2013.03.4-2013.03.6)] International Symposium on Quality Electronic Design (ISQED) - Welcome to ISQED 2013

Budnik, Mark, Topaloglu, Rasit, Chatterjee, Pallab, Bowman, Keith, Gadepally, Kamesh, Wesling, Paul, Alam, Syed M., Joshi, Rajiv

Year:

2013

Language:

english

File:

PDF, 26 KB

english, 2013

10

[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Welcome to ISQED 2010

Gadepally, Kamesh, Immaneni, Lalitha, Chatterjee, Pallab, Alexiou, George, Iranmanesh, Ali

Year:

2010

Language:

english

File:

PDF, 59 KB

english, 2010

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